The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs have additional software enhancements than enable them to focus the beam on a photomask for E-beam lithography or are equipped for focused ion beam (FIB) milling. This video is part 1 of a 6-part series, and gives a tour of the device, and describes how to prepare a sample.
By the Center on Materials and Devicesd for Information Technology Research
Other videos in the series
The title says it all: this blog features physics videos found everywhere on the web: animations, demonstrations, lectures, documentaries.