Other videos in this series
Showing posts with label Scanning electron microscope. Show all posts
Showing posts with label Scanning electron microscope. Show all posts
Saturday, 10 September 2011
Tuesday, 30 August 2011
Thursday, 11 August 2011
Wednesday, 3 August 2011
Wednesday, 27 July 2011
Scanning Electron Microscope: Pt 2 of 6
Scanning Electron Microscope part 2: Loading the sample
Filmed at the University of Washington Nano Tech User Facility.
Other videos in the series
Filmed at the University of Washington Nano Tech User Facility.
Other videos in the series
Sunday, 17 July 2011
Scanning Electron Microscope: Pt 1 of 6
The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs have additional software enhancements than enable them to focus the beam on a photomask for E-beam lithography or are equipped for focused ion beam (FIB) milling. This video is part 1 of a 6-part series, and gives a tour of the device, and describes how to prepare a sample.
By the Center on Materials and Devicesd for Information Technology Research
Other videos in the series
By the Center on Materials and Devicesd for Information Technology Research
Other videos in the series
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